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Glass thickness and refractive index determine the quality
Tokyo Optical Technology Exhibition - Photonix 2021
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Novitec participated in Photonix 2021, an optical technology exhibition held at Tokyo Makuhari Exhibition Center for 3 days from December 8th to December 10th.
The Photonix exhibition is the largest exhibition in Japan specializing in laser and optical technology, where world-class companies exhibit lasers, optical components, optical measuring devices, and analysis equipment to identify trends in the optical market and share technical information.
Novitec exhibited t-Nova-SDI, a non-contact thickness and refractive index sensor, and s-Nova series, a high-speed spectrometer, that can be used for various fields such as semiconductor display manufacturing inspection, medical and biological analysis.
Thank you very much for your interest. |
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Ultrafast thickness measurement sensor
t-Nova-SDI 1550
- Simultaneous measurement of physical thickness
and refractive index
- Vibration insensitive measurement
- High speed measurement & High precision
- Wide applicability to various substrate materials
(Glass, Silicon wafer, etc.) |
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High-speed spectrometer enabling pc-less
ultra-fast thickness measurement
s-Nova-850
- Wavelength range : 750 - 950 nm
- Wavelength accuracy : 0.1 nm
- Measurement speed : 250 kHz
- Optimal for various optical measuring devices,
Thin film analysis, OCT |
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High-speed spectrometer enabling pc-less
ultra-fast thickness measurement
s-Nova-1550
- Wavelength range : 1490 - 1610 nm
- Wavelength accuracy : 0.1 nm
- Measurement speed : 40 kHz
- Optimal for various optical measuring devices,
silicon wafer thickness measurement
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May the new year bring your health, happiness, and all other good things.
Wishing you a wonderful end of 2021,
and all the best wishes to you in a new year.
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